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Comparison of properties inherent to thin titanium oxide films formed by rapid thermal annealing on SiC and porous SiC substrates von Yu. Yu. Bacherikov, N. L. Dmitruk, R. V. Konakova, O. F. Kolomys, O. B. Okhrimenko, V. V. Strelchuk, O. S. Lytvyn, L. M. Kapitanchuk, A. M. Svetlichnyi

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