Dopant depth profile modification during mass Spectrometric analysis of multilayer nanostructures

за авторством A. A. Efremov, V. G. Litovchenko, V. P. Melnik, O. S. Oberemok, V. G. Popov, B. M. Romanyuk
Опубліковано 2015

Oxygen ion-beam modification of vanadium oxide films for reaching a high value of the resistance temperature coefficient

за авторством T. M. Sabov, O. S. Oberemok, O. V. Dubikovskyi, V. P. Melnik, V. P. Kladko, B. M. Romanyuk, V. G. Popov, Yo. Gudymenko, N. V. Safriuk
Опубліковано 2017

Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer

за авторством A. V. Sachenko, V. P. Kostylev, V. G. Litovchenko, V. G. Popov, B. M. Romanyuk, V. V. Chernenko, V. M. Naseka, T. V. Slusar, S. I. Kyrylova, F. F. Komarov
Опубліковано 2013