Харвестер відкритої науки НАН України

Dopant depth profile modification during mass Spectrometric analysis of multilayer nanostructures

von A. A. Efremov, V. G. Litovchenko, V. P. Melnik, O. S. Oberemok, V. G. Popov, B. M. Romanyuk
Veröffentlicht 2015

Oxygen ion-beam modification of vanadium oxide films for reaching a high value of the resistance temperature coefficient

von T. M. Sabov, O. S. Oberemok, O. V. Dubikovskyi, V. P. Melnik, V. P. Kladko, B. M. Romanyuk, V. G. Popov, Yo. Gudymenko, N. V. Safriuk
Veröffentlicht 2017

Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer

von A. V. Sachenko, V. P. Kostylev, V. G. Litovchenko, V. G. Popov, B. M. Romanyuk, V. V. Chernenko, V. M. Naseka, T. V. Slusar, S. I. Kyrylova, F. F. Komarov
Veröffentlicht 2013