X-ray diffraction study of deformation state in InGaN/GaN multilayered structures von V. P. Kladko, A. V. Kuchuk, N. V. Safryuk, V. F. Machulin, A. E. Belyaev, R. V. Konakova, B. S. Yavich

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Formation of ohmic contacts to n(p)-gan and measurement of their contact resistivity von M. S. Boltovets, V. M. Ivanov, R. V. Konakova, Ya. Ya. Kudryk, V. V. Milenin, V. V. Shynkarenko, V. M. Sheremet, Yu. N. Sveshnikov, B. S. Yavich

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Deformation state of short-period AlGaN/GaN superlattices at different well-barrier thickness ratios von V. P. Kladko, N. V. Safriuk, H. V. Stanchu, A. V. Kuchuk, V. P. Melnyk, A. S. Oberemok, S. B. Kriviy, Z. V. Maksymenko, A. E. Belyaev, B. S. Yavich

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