On Method Concept for Safety Culture Assessment with Application of Inductive Learning Algorithms за авторством Begun, V.V., Lytvynov, V.V., Begun, S.V.

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Charge characteristics of the MOS structures with oxide films containing Si nanocrystals за авторством Begun, E.V., Bratus’, O.L., Evtukh, A.A., Kaganovich, E.B., Manoilov, E.G.

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