Харвестер відкритої науки НАН України

Dielectric, ferroelectric and piezoelectric properties of sputtered PZT thin films on Si substrates: influence of film thickness and orientation

von Haccart, T., Cattan, E., Remiens, D.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2002)

Partial polarization switching in ferroelectrics-semiconductors with charged defects

von Morozovska, A.N., Eliseev, E.A., Cattan, E., Remiens, D.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2004)

Peculiarities and asymmetry of polarization reversal in Pt/PZT-film/Pt:Ti/SiO₂/Si-substrate structures in pyroelectric response investigations

von Bravina, S.L., Cattan, E., Morozovsky, N.V., Remiens, D.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2004)

Thin film PZT-Si structure with quadrant-diagonal electrode system as an element of position sensitive pyroelectric detector

von Bravina, S.L., Cattan, E., Morozovsky, N.V., Remiens, D.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2002)