New Method and Tool for TEM Samples Preparation by Boguslavsky, D., Cherepin, V., Polubotko, Y., Smith, C.

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Secondary Ion Emission during the Proton Bombardment of Metal Surfaces by Cherepin, V.T., Vasylyev, M.O., Makeeva, I.M., Kolesnik, V.M., Voloshko, S.M.

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