Search Results - Claeys, T.
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Microfluctuations of oxygen impurity concentration as a reason of accelerated oxygen diffusion in silicon by Neimash, V.B., Puzenko, O.O., Kraitchinskii, A.M., Krasko, M.M., Putselyk, S., Claeys, C., Simoen, E.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2000)Get full text
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