Temperature and concentration dependences of specific heat of Bi₁-xSbx solid solutions von Rogacheva, E.I., Doroshenko, A.N., Nashchekina, O.N.

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Dependence of minority charge carriers lifetime on point defects type and their concentration in single-crystal silicon von Zaitsev, R.V., Kopach, V.R., Kirichenko, M.V., Doroshenko, A.N., Khrypunov, G.S.

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