Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors von Slipokurov, V.S., Dub, M.M., Tkachenko, A.K., Kudryk, Ya.Ya.

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Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors von Slipokurov, V.S., Dub, M.M., Tkachenko, A.K., Kudryk, Ya.Ya.

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Method for data processing in application to ohmic contacts von Belyaev, A.E., Boltovets, N.S., Konakova, R.V., Kovtonjuk, V.M., Kudryk, Ya.Ya., Shynkarenko, V.V., Dub, M.M., Saj, P.O., Novitskii, S.V.

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