Search Results - Dub, M.M.

  • Showing 1 - 3 results of 3
Refine Results
  1. 1
    Cover Image

    Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors by Slipokurov, V.S., Dub, M.M., Tkachenko, A.K., Kudryk, Ya.Ya.

    Get full text
    Article

    Save to List
    Saved in:
  2. 2
    Cover Image

    Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors by Slipokurov, V.S., Dub, M.M., Tkachenko, A.K., Kudryk, Ya.Ya.

    Get full text
    Article

    Save to List
    Saved in:
  3. 3
    Cover Image

    Method for data processing in application to ohmic contacts by Belyaev, A.E., Boltovets, N.S., Konakova, R.V., Kovtonjuk, V.M., Kudryk, Ya.Ya., Shynkarenko, V.V., Dub, M.M., Saj, P.O., Novitskii, S.V.

    Get full text
    Article

    Save to List
    Saved in:

Search Tools: