Transformations of microdefect structure in silicon crystals under the influence of weak magnetic field von T. P. Vladimirova, Ye. M. Kyslovs`kyy, V. B. Molodkin, S. I. Olikhovskii, O. V. Koplak, E. V. Kochelab

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The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model von V. V. Lizunov, E. V. Kochelab, E. S. Skakunova, E. G. Len, V. B. Molodkin, S. I. Olikhovskij, N. G. Tolmachjov, B. V. Sheludchenko, S. V. Lizunova, L. N. Skapa

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The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. II. Numerical experiment von V. V. Lizunov, E. V. Kochelab, E. S. Skakunova, E. G. Len, V. B. Molodkin, S. I. Olikhovskij, N. G. Tolmachjov, B. V. Sheludchenko, S. V. Lizunova, L. N. Skapa

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