Transformations of microdefect structure in silicon crystals under the influence of weak magnetic field

за авторством T. P. Vladimirova, Ye. M. Kyslovs`kyy, V. B. Molodkin, S. I. Olikhovskii, O. V. Koplak, E. V. Kochelab
Опубліковано 2011

The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model

за авторством V. V. Lizunov, E. V. Kochelab, E. S. Skakunova, E. G. Len, V. B. Molodkin, S. I. Olikhovskij, N. G. Tolmachjov, B. V. Sheludchenko, S. V. Lizunova, L. N. Skapa
Опубліковано 2015

The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. II. Numerical experiment

за авторством V. V. Lizunov, E. V. Kochelab, E. S. Skakunova, E. G. Len, V. B. Molodkin, S. I. Olikhovskij, N. G. Tolmachjov, B. V. Sheludchenko, S. V. Lizunova, L. N. Skapa
Опубліковано 2015