Enhanced 2D plotting method for scanning probe microscopy imaging von G. V. Beketov

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Surface wetting and contact angle: basics and characterisation von G. V. Beketov, O. V. Shynkarenko

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Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy von O. V. Rengevych, G. V. Beketov, Yu. V. Ushenin

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Trap-assisted conductivity in anodic oxide on InSb von G. V. Beketov, A. V. Sukach, V. V. Tetyorkin, S. P. Trotsenko

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Features of ultrasound absorption by dislocations in subgrain-free Cs0.2Hg0.8Te crystals von I. O. Lysiuk, Ya. M. Olikh, Ya. Olikh, G. V. Beketov

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