Open Science Harvester of NAS of Ukraine

Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements

by Gomeniuk, Yu.V.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2012)

Морфологія та оптичні властивості нанокластерів Ge на окисленій поверхні Si(001)

by Lysenko, V.S., Kondratenko, S.V., Kozyrev, Yu.N., Rubezhanska, M.Yu., Kladko, V.P., Gomeniuk, Yu.V., Gudymenko, O.Y., Melnichuk, Ye.Ye., Grenet, G., Blanchard, N.B.
Published 2021

Electroluminescent properties of Tb-doped carbon-enriched silicon oxide

by Tiagulskyi, S.I., Nazarov, A.N., Gordienk, S.O., Vasin, A.V., Rusavsky, A.V., Nazarova, T.M., Gomeniuk, Yu.V., Rudko, G.V., Lysenko, V.S., Rebohle, L., Voelskow, M., Skorupa, W., Koshka, Y.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2014)