Search Results - Graeff, W.
- Showing 1 - 1 results of 1
-
1
Defect structure of Czochralski silicon co-implanted with helium and hydrogen and treated at high temperature - pressure by Wierzchowski, W., Misiuk, A., Wieteska, K., Bak-Misiuk, J., Jung, W., Shalimov, A., Graeff, W., Prujszczyk, M.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2005)Get full text
Article