Crystal defects in epitaxial InP layers: electrical and scanning electron microscope study

за авторством Horvath, Zs.J., Toth, A.L., Rakovics, V., Paszti, Z., Peto, G.
Опубліковано 2004

Current flow mechanisms in p-i-n­ structures based on cadmium telluride

за авторством Gorley, P.M., Demych, M.V., Makhniy, V.P., Horvath, Zs.J., Shenderovsky, V.A.
Опубліковано 2002

Effect of dislocations in relaxed MBE SiGe layers on the electrical behavior of Si/SiGe heterostructures

за авторством Horvath, Zs.J., Orlov, L.K., Ivina, N.L., Demidov, E.S., Vdovin, V.I., Adam, M., Szabo, I., Dozsa, L., Pashaev, E.M., Ivanov, Yu.M., Yakunin, S.N.
Опубліковано 2004