Харвестер відкритої науки НАН України

Crystal defects in epitaxial InP layers: electrical and scanning electron microscope study

von Horvath, Zs.J., Toth, A.L., Rakovics, V., Paszti, Z., Peto, G.
Veröffentlicht in Functional Materials (2004)

Current flow mechanisms in p-i-n­ structures based on cadmium telluride

von Gorley, P.M., Demych, M.V., Makhniy, V.P., Horvath, Zs.J., Shenderovsky, V.A.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2002)

Effect of dislocations in relaxed MBE SiGe layers on the electrical behavior of Si/SiGe heterostructures

von Horvath, Zs.J., Orlov, L.K., Ivina, N.L., Demidov, E.S., Vdovin, V.I., Adam, M., Szabo, I., Dozsa, L., Pashaev, E.M., Ivanov, Yu.M., Yakunin, S.N.
Veröffentlicht in Functional Materials (2004)