Харвестер відкритої науки НАН України

Comprehensive investigation of defects in highly perfect silicon single crystals

von Prokopenko, I.V., Kislovskii, E.N., Olikhovskii, S.I., Tkach, V.M., Lytvyn, P.M., Vladimirova, T.P.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2000)

Structural changes in multilayer systems containing InxGa₁₋xAs₁₋yNy quantum wells

von Fodchuk, I.M., Gevyk, V.B., Gimchinsky, O.G., Kislovskii, E.N., Kroytor, O.P., Molodkin, V.B., Olihovskii, S.I., Pavelescu, E.M., Pessa, M.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of St...

von Molodkin, V.B., Olikhovskii, S.I., Skakunova, E.S., Len, E.G., Kislovskii, E.N., Reshetnyk, O.V., Vladimirova, T.P., Lizunov, V.V., Skapa, L.N., Lizunova, S.V., Fuzik, E.V., Tolmachev, N.G., Ostafiychuk, B.K., Pylypiv, V.M., Garpul’, O.Z.
Veröffentlicht in Металлофизика и новейшие технологии (2015)