Харвестер відкритої науки НАН України

Comprehensive investigation of defects in highly perfect silicon single crystals

за авторством Prokopenko, I.V., Kislovskii, E.N., Olikhovskii, S.I., Tkach, V.M., Lytvyn, P.M., Vladimirova, T.P.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2000)

Structural changes in multilayer systems containing InxGa₁₋xAs₁₋yNy quantum wells

за авторством Fodchuk, I.M., Gevyk, V.B., Gimchinsky, O.G., Kislovskii, E.N., Kroytor, O.P., Molodkin, V.B., Olihovskii, S.I., Pavelescu, E.M., Pessa, M.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of St...

за авторством Molodkin, V.B., Olikhovskii, S.I., Skakunova, E.S., Len, E.G., Kislovskii, E.N., Reshetnyk, O.V., Vladimirova, T.P., Lizunov, V.V., Skapa, L.N., Lizunova, S.V., Fuzik, E.V., Tolmachev, N.G., Ostafiychuk, B.K., Pylypiv, V.M., Garpul’, O.Z.
Опубліковано в: Металлофизика и новейшие технологии (2015)