Multilayer X-ray mirrors Mo-B₄C- new crystals-analyzers for wavelength range of 5 to 12 A von Kopylets, I.A., Baturin, A.A., Mikhailov, I.F.

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Structural-phase transformations in magnetron deposited films of Ti-Zr-Ni systems during annealing in vacuum von Malykhin, S.V., Kondratenko, V.V., Kopylets, I.A., Bogdanov, Yu.S., Surovitsky, S.V., Borisova, S.S., Shipkova, I.G.

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Structure and mechanical stresses in TaSi₂/Si multilayer von Devizenko, A.Yu., Kopylets, I.A., Kondratenko, V.V., Pershyn, Y.P., Devizenko, I.Y., Zubarev, E.N., Savitskiy, B.A.

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Stability of thin quasi-crystalline Ti-Zr-Ni films and related crystalline phases under low-energy transient plasma irradiation von Malykhin, S.V., Kondratenko, V.V., Makhlai, V.A., Garkusha, I.E., Kopylets, I.A., Borisov, Yu.S., Herashchenko, S.S., Surovitskiy, S.V., Borisova, S.S.

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