Temperature effect on the characteristics and lifetime of semiconductor detectors by Vasiliyev, G.P., Kosinov, A.V., Kulibaba, V.I., Maslov, N.I., Naumov, S.V., Ovchinnik, V.D., Yalovenko, V.I.

Get full text

Development of technique for testing the long-term stability of silicon microstrip detectors by Kosinov, A.V., Maslov, N. I., Naumov, S. V., Ovchinni, V. D., Starodubtsev, A. F., Vasilyev, G. P., Yalovenko, V. I., Bosisio, L.

Get full text

Examination ofmulti-layer silicon detector in measurementofelectron spectrumfor beta-decayof ⁹⁰SR- ⁹⁰Y by Bochek, G.L., Golovash, A.S., Kosinov, A.V., Kotlyar, V.V., Kulibaba, V.I., Maslov, N.I., Mazilov, A.A., Naumov, S.V., Ovchinnik, V.D.

Get full text