Search Results - Krüger, D.

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    AES and XPS characterization of TiN layers formed and modified by ion implantation by Melnik, V., Popov, V., Kruger, D., Oberemok, O.

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    Ultrasound effect on radiation damages in boron implanted silicon by Romanjuk, B., Krüger, D., Melnik, V., Popov, V., Olikh, Ya., Soroka, V., Oberemok, O.

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