Харвестер відкритої науки НАН України

AES and XPS characterization of TiN layers formed and modified by ion implantation

von Melnik, V., Popov, V., Kruger, D., Oberemok, O.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (1999)

Ultrasound effect on radiation damages in boron implanted silicon

von Romanjuk, B., Krüger, D., Melnik, V., Popov, V., Olikh, Ya., Soroka, V., Oberemok, O.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2000)