Open Science Harvester of NAS of Ukraine

Microfluctuations of oxygen impurity concentration as a reason of accelerated oxygen diffusion in silicon

by Neimash, V.B., Puzenko, O.O., Kraitchinskii, A.M., Krasko, M.M., Putselyk, S., Claeys, C., Simoen, E.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2000)

Вплив олова на структурнi перетворення тонкоплiвкової субоксидної матрицi кремнiю

by Voitovych, V. V., Rudenko, R. M., Yuchymchuk, V. O., Voitovych, M. V., Krasko, M. M., Kolosiuk, A. G., Povarchuk, V. Yu., Khachevich, I. M., Rudenko, M. P.
Published 2019