Using ellipsometry methods for depth analyzing the optical disc data layer relief structures von Kravets, V.G., Gorbov, I.V.

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Luminescence of the pyrazoline dye in nanostructured zeolite matriх von Beliak, I.V., Kravets, V.G., Kryuchin, A.A.

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TMR, MRE, and X-ray photoelectron spectroscopy of Fe-SiO₂ granular films von Kravets, V.G., Poperenko, L.V., Vinnichenko, K.L.

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Optical properties of graphene film growing on a thin copper layer von Rozouvan, T.S., Poperenko, L.V., Kravets, V.G., Shaykevich, I.A.

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Optical properties of the modified structures of surface layers of amorphous metallic alloy ribbons von Poperenko, L.V., Kravets, V.G., Lysenko, S.I., Vinnichenko, K.L.

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Ellipsometry and optical spectroscopy of low-dimensional family TMDs von Kravets, V.G., Prorok, V.V., Poperenko, L.V., Shaykevich, I.A.

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Optical and magneto-optical properties of thin films for high density information recording von Kravets, V.G., Poperenko, L.V., Yurgelevich, I.V., Petford-Long, A.K.

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