Using ellipsometry methods for depth analyzing the optical disc data layer relief structures by Kravets, V.G., Gorbov, I.V.

Get full text

Luminescence of the pyrazoline dye in nanostructured zeolite matriх by Beliak, I.V., Kravets, V.G., Kryuchin, A.A.

Get full text

TMR, MRE, and X-ray photoelectron spectroscopy of Fe-SiO₂ granular films by Kravets, V.G., Poperenko, L.V., Vinnichenko, K.L.

Get full text

Optical properties of graphene film growing on a thin copper layer by Rozouvan, T.S., Poperenko, L.V., Kravets, V.G., Shaykevich, I.A.

Get full text

Optical properties of the modified structures of surface layers of amorphous metallic alloy ribbons by Poperenko, L.V., Kravets, V.G., Lysenko, S.I., Vinnichenko, K.L.

Get full text

Ellipsometry and optical spectroscopy of low-dimensional family TMDs by Kravets, V.G., Prorok, V.V., Poperenko, L.V., Shaykevich, I.A.

Get full text

Optical and magneto-optical properties of thin films for high density information recording by Kravets, V.G., Poperenko, L.V., Yurgelevich, I.V., Petford-Long, A.K.

Get full text