Open Science Harvester of NAS of Ukraine

Origin of surface layer on common substrates for functional material films probed by ellipsometry

by Belyaeva, A.I., Galuza, A.A., Kudlenko, A.D.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

Effect of exposure inside the LHD vessel on reflectance of stainless steel mirrors

by Voitsenya, V.S., Sagara, A., Bardamid, A.F., Belyaeva, A.I., Bondarenko, V.N., Kudlenko, A.D., Konovalov, V.G., Solodovchenko, S.I.
Published in Вопросы атомной науки и техники (2002)

The optical characteristics of contaminating films on Mo, SS and Cu mirror samples exposed in plasma devices

by Bondarenko, V.N., Belyaeva, A.I., Galuza, A.A., Konovalov, V.G., Kudlenko, A.D., Ryzhkov, I.V., Shtan’, A.F., Solodovchenko, S.I., Voitsenya, V.S.
Published in Вопросы атомной науки и техники (2008)