Харвестер відкритої науки НАН України

Origin of surface layer on common substrates for functional material films probed by ellipsometry

von Belyaeva, A.I., Galuza, A.A., Kudlenko, A.D.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

Effect of exposure inside the LHD vessel on reflectance of stainless steel mirrors

von Voitsenya, V.S., Sagara, A., Bardamid, A.F., Belyaeva, A.I., Bondarenko, V.N., Kudlenko, A.D., Konovalov, V.G., Solodovchenko, S.I.
Veröffentlicht in Вопросы атомной науки и техники (2002)

The optical characteristics of contaminating films on Mo, SS and Cu mirror samples exposed in plasma devices

von Bondarenko, V.N., Belyaeva, A.I., Galuza, A.A., Konovalov, V.G., Kudlenko, A.D., Ryzhkov, I.V., Shtan’, A.F., Solodovchenko, S.I., Voitsenya, V.S.
Veröffentlicht in Вопросы атомной науки и техники (2008)