Three-step electronic speckle pattern interferometry method with arbitrary phase shifts of reference wave von L. I. Muravsky

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Retrieving the surface relief components using phase-shifting interferometry and Gaussian filter von I. V. Stasyshyn, Y. M. Kotsiuba, L. I. Muravsky, T. I. Voronyak

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The new approach to identification of film reflecting holographic marks von S. O. Kostyukevych, L. I. Muravsky, V. M. Fitio, T. I. Voronyak, P. E. Shepeliavyi, K. V. Kostyukevych, N. L. Moskalenko, V. I. Pogoda

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