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1Evolution of structural and electrophysical parameters of Ni/SiC contacts at rapid thermal annealingvon Litvinov, V.L., Demakov, K.D., Agueev, O.A., Svetlichny, A.M., Konakova, R.V., Lytvyn, P.M., Lytvyn, O.S., Milenin, V.V.Volltext
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2002)
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