Simulation of X-Ray Diffraction Spectra for AlN/GaN Multiple Quantum Well Structures on AlN(0001) with Interface Roughness and Variation of Vertical Layers Thickness von Liubchenko, O.I., Kladko, V.P.

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Modeling of X-ray rocking curves for layers after two-stage ion-implantation von Liubchenko, O.I., Kladko, V.P., Gudymenko, O.Yo.

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Дослідження пасток в гетероструктурах AlGaN/GaN ультразвуковими коливаннями von Kaliuzhnyi, V.V., Liubchenko, O.I., Tymochko, M.D., Olikh, Y.M., Kladko, V.P., Belyaev, A.E.

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The effect of ion implantation on structural damage in compositionally graded AlGaN layers von Liubchenko, O.I., Kladko, V.P., Stanchu, H.V., Sabov, T.M., Melnik, V.P., Kryvyi, S.B., Belyaev, A.Ye.

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