Determination of adhesion strength of thin oxide coatings on dielectric materials by the method of atomic force microscopy von S. A. Bilokon, M. A. Bondarenko, Ju. Ju. Bondarenko

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Mathematical Modeling of DNA Damages in Irradiated Cells at Different Oxygenation Degrees von M. A. Bondarenko, V. G. Knigavko, O. V. Zaytseva, A. S. Rukin

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Role of phosphorus and sulfur atoms in radiation damage of nucleic acids and proteins von V. G. Knigavko, M. A. Bondarenko, L. V. Batjuk, N. S. Ponomarenko

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