Search Results - Misiuk, A.
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Defect structure of Czochralski silicon co-implanted with helium and hydrogen and treated at high temperature - pressure by Wierzchowski, W., Misiuk, A., Wieteska, K., Bak-Misiuk, J., Jung, W., Shalimov, A., Graeff, W., Prujszczyk, M.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2005)Get full text
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Structure perfection variations of Si crystals grown by Czochralski or floating zone methods after implantation of oxygen or neon atoms followed by annealing by Datsenko, L.I., Auleytner, J., Misiuk, A., Klad'ko, V.P., Machulin, V.F., Bak-Misiuk, J., Zymierska, D., Antonova, I.V., Melnyk, V.M., Popov, V.P., Czosnyka, T., Choinski, J.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (1999)Get full text
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