Determination of chemical composition of implanted nanolayers by analysis of their optical properties von Mysiura, I.N., Girka, I.O., Gritsyna, V.T.

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α-particle induced forward-backward electron emission from titanium nitride von Zhurenko, V.P., Kononenko, S.I., Kalantaryan, O.V., Mysiura, I.N., Avotin, S.S., Rokhmanov, N.Ja.

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Features of electron beam evaporation under surface electron beam formation von Mysiura, I.N., Girka, I.A., Azarenkov, N.A., Borgun, Ie.V., Hrechko, Ya.O., Hryhorenko, A.V., Dimitrova, V.D., Ryabchikov, D.L., Sereda, I.N., Tseluyko, A.F.

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