Determination of chemical composition of implanted nanolayers by analysis of their optical properties by Mysiura, I.N., Girka, I.O., Gritsyna, V.T.

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α-particle induced forward-backward electron emission from titanium nitride by Zhurenko, V.P., Kononenko, S.I., Kalantaryan, O.V., Mysiura, I.N., Avotin, S.S., Rokhmanov, N.Ja.

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Features of electron beam evaporation under surface electron beam formation by Mysiura, I.N., Girka, I.A., Azarenkov, N.A., Borgun, Ie.V., Hrechko, Ya.O., Hryhorenko, A.V., Dimitrova, V.D., Ryabchikov, D.L., Sereda, I.N., Tseluyko, A.F.

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