Determination of fundamental optical constant of Zn2SnO4 films von A. O. Salohub, A. A. Voznyi, O. V. Klymov, N. V. Safryuk, D. I. Kurbatov, A. S. Opanasyuk

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X-ray diffraction study of deformation state in InGaN/GaN multilayered structures von V. P. Kladko, A. V. Kuchuk, N. V. Safryuk, V. F. Machulin, A. E. Belyaev, R. V. Konakova, B. S. Yavich

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Features of the formation of ohmic contacts to n+-InN von P. O. Sai, N. V. Safryuk-Romanenko, D. B. But, G. Cywiński, N. S. Boltovets, P. N. Brunkov, N. V. Jmeric, S. V. Ivanov, V. V. Shynkarenko

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Features of the formation of ohmic contacts to n+-InN von P. O. Sai, N. V. Safryuk-Romanenko, D. B. But, G. Cywiński, N. S. Boltovets, P. N. Brunkov, N. V. Jmeric, S. V. Ivanov, V. V. Shynkarenko

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