Search Results - O. Golenkov

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    Measuring system for testing electrical parameters of EMCCDs of various formats by V. Zabudsky, O. Golenkov, O. Rikhalsky, V. Reva, S. Korinets, S. Dukhnin, R. Mytiai

    Published 2019
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  2. 2
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    Carrier decay lifetimes in the narrow-gap Hg1 – xCdxTe at the interband and intraband excitations by S. Staryi, I. Lysjuk, O. Golenkov, Z. Tsybrii, S. Danilov, J. Gumenjuk-Sichevska, K. Andrieieva, M. Smolii, F. Sizov

    Published 2023
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  3. 3
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    Carrier decay lifetimes in the narrow-gap Hg1 – xCdxTe at the interband and intraband excitations by S. Staryi, I. Lysjuk, O. Golenkov, Z. Tsybrii, S. Danilov, J. Gumenjuk-Sichevska, K. Andrieieva, M. Smolii, F. Sizov

    Published 2023
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