Investigation of cadmium telluride films on silicon substrate von Odarych, V.A., Sarsembaeva, A.Z., Sizov, F.F., Vuichyk, M.V.

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Determination of parameters of cadmium telluride films on silicon by the methods of main angle and multiangular ellipsometry von Odarych, V.A., Sarsembaeva, A.Z., Vuichyk, M.V., Sizov, F.F.

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Determination of optical parameters of CdTe films by principal angle ellypsometry von Kornienko, K.N., Odarych, V.A., Poperenko, L.V., Vuichik, N.V.

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Прибор и методы измерения параметров и степени однородности пленочных структур von Makara, V. A., Odarych, V. A., Kepich, T. Yu., Preobragenskaya, T. D., Rudenko, O. V.

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Optical parameters of the film naturally formed on the surface of cadmium telluride single crystals von Odarych, V.A., Poperenko, L.V., Yurgelevych, I.V., Gnatyuk, V.A., Toru Aoki

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