Open Science Harvester of NAS of Ukraine

Determination of parameters of cadmium telluride films on silicon by the methods of main angle and multiangular ellipsometry

by Odarych, V.A., Sarsembaeva, A.Z., Vuichyk, M.V., Sizov, F.F.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2006)

Investigation of cadmium telluride films on silicon substrate

by Odarych, V.A., Sarsembaeva, A.Z., Sizov, F.F., Vuichyk, M.V.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2005)

Determination of optical parameters of CdTe films by principal angle ellypsometry

by Kornienko, K.N., Odarych, V.A., Poperenko, L.V., Vuichik, N.V.
Published in Functional Materials (2006)

Структура окисної плівки на поверхні поруватого кремнію

by Zavalistyi, O. I., Makarenko, O. V., Odarych, V. A., Yampolskyi, A. L.
Published 2020

Прибор и методы измерения параметров и степени однородности пленочных структур

by Makara, V. A., Odarych, V. A., Kepich, T. Yu., Preobragenskaya, T. D., Rudenko, O. V.
Published 2009

Optical parameters of the film naturally formed on the surface of cadmium telluride single crystals

by Odarych, V.A., Poperenko, L.V., Yurgelevych, I.V., Gnatyuk, V.A., Toru Aoki
Published in Functional Materials (2013)