Search Results - Olikh, Ja.М.
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Influence of ultrasound treatment and dynamic (in-situ) ultrasound loading on the temperature hysteresis of electrophysical characteristics in irradiated n-Si–Fz by Babych, V.М., Olikh, Ja.М., Tymochko, M.D.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2009)Get full text
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