Spatial resolution of scanning tunneling microscopy von Rozouvan, T., Poperenko, L., Shaykevich, I., Rozouvan, S.

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Magnetic nano-ordering in polycrystal and monocrystal chromium von Rozouvan, T., Yurgelevich, I., Rozouvan, S., Poperenko, L.

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Ellipsometric control of stress homogeneity in surface layer of amorphous metal alloy ribbons von Poperenko, L.V., Ozerov, M.V.

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Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique von Rozouvan, T.S., Poperenko, L.V., Shaykevich, I.A.

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Investigations of characteristics of metal film based pyroelectric detectors implanted by Ar+ ions von Lysyuk, V.O., Poperenko, L.V., Staschuk, V.S.

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Influence of oxide layers on optical properties of copper in a wide spectral range von Filipov, Y.V., Staschuk, V.S., Poperenko, L.V.

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Spectral properties of reflective interference filters von Pervak, V.Yu., Poperenko, L.V., Pervak, Yu.A.

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TMR, MRE, and X-ray photoelectron spectroscopy of Fe-SiO₂ granular films von Kravets, V.G., Poperenko, L.V., Vinnichenko, K.L.

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Optical properties of TiAISiN based thin films von Nakonechna, O.I., Poperenko, L.V., Yurgelevych, I.V.

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London forces in highly oriented pyrolytic graphite von Poperenko, L.V., Rozouvan, S.G., Shaykevich, I.A.

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Optical investigation of the electronic structure of alloys Сu-Fе von Vovchenko, V.V., Staschuk, V.S., Poperenko, L.V., Lysiuk, V.O.

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Ellipsometry examination of copper alloys with transitive metals von Filipov, Y.V., Staschuk, V.S., Poperenko, L.V., Vovchenko, V.V.

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Optical properties of graphene film growing on a thin copper layer von Rozouvan, T.S., Poperenko, L.V., Kravets, V.G., Shaykevich, I.A.

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Detection of biomolecules using optoelectronic biosensor based on localized surface plasmon resonance. Nanoimprint lithography approach von Chegel, V., Luca, B., Guo, J., Lopatynskyi, A., Lopatynska, O., Poperenko, L.

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Influence of irradiation by a particle beam on optical properties of metal mirrors von Poperenko, L.V., Vinnichenko, M.V., Kosel, P.B., Vinnichenko, K.L.

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Determination of optical parameters of CdTe films by principal angle ellypsometry von Kornienko, K.N., Odarych, V.A., Poperenko, L.V., Vuichik, N.V.

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Optical properties of the modified structures of surface layers of amorphous metallic alloy ribbons von Poperenko, L.V., Kravets, V.G., Lysenko, S.I., Vinnichenko, K.L.

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Ellipsometry and optical spectroscopy of low-dimensional family TMDs von Kravets, V.G., Prorok, V.V., Poperenko, L.V., Shaykevich, I.A.

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The role of the magnetic component of a strong light field in the electrostrictive effect von Poperenko, L.V., Prorok, V.V., Rozouvan, S.G., Shaykevich, I.A.

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Optical and magneto-optical properties of thin films for high density information recording von Kravets, V.G., Poperenko, L.V., Yurgelevich, I.V., Petford-Long, A.K.

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