Manufacturing technology for contacts to silicon carbide by Ja. Ja. Kudrik, R. I. Bigun, Ja. Kudrik

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Determination of the Schottky barrier height in diodes based on Au-TiB2-n-SiC 6H from the current-voltage and capacitance-voltage characteristics by Ya. Ya. Kudryk, V. V. Shynkarenko, V. S. Slipokurov, R. I. Bigun, Ya. Kudryk

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Methods for deter-mination of schottky barrier height from I-V curves (review) by Ja. Ja. Kudrik, V. V. Shinkarenko, V. S. Slepokurov, R. I. Bigun, Ja. Kudrik

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Technique and setup for diagnostics of p-n junction to case thermal resistance in high-power gallium nitride LEDs by V. M. Sorokin, R. V. Konakova, Ya. Ya. Kudryk, A. V. Zinovchuk, R. I. Bigun, Ya. Kudryk, V. V. Shynkarenko

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