Dielectric, ferroelectric and piezoelectric properties of sputtered PZT thin films on Si substrates: influence of film thickness and orientation

за авторством Haccart, T., Cattan, E., Remiens, D.
Опубліковано 2002

Partial polarization switching in ferroelectrics-semiconductors with charged defects

за авторством Morozovska, A.N., Eliseev, E.A., Cattan, E., Remiens, D.
Опубліковано 2004

Peculiarities and asymmetry of polarization reversal in Pt/PZT-film/Pt:Ti/SiO₂/Si-substrate structures in pyroelectric response investigations

за авторством Bravina, S.L., Cattan, E., Morozovsky, N.V., Remiens, D.
Опубліковано 2004

Thin film PZT-Si structure with quadrant-diagonal electrode system as an element of position sensitive pyroelectric detector

за авторством Bravina, S.L., Cattan, E., Morozovsky, N.V., Remiens, D.
Опубліковано 2002

Modelling of pyroelectric response in inhomogeneous ferroelectric-semiconductor films

за авторством Morozovska, A.N., Eliseev, E.A., Remiens, D., Soyer, C.
Опубліковано 2006