Search Results - Rengevych, O.V.

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    Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy by Rengevych, O.V., Beketov, G.V., Ushenin, Yu.V.

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    Separate determination of thickness and optical parameters by surface plasmon resonance: accuracy consideration by Rengevych, O.V., Shirshov, Yu.M., Ushenin, Yu.V, Beketov, A.G.

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    AFM study of micromorphology and microscopic growth mechanisms of Hg₁₋x CdxTe LPE epitaxial layers by Beketov, G.V., Rashkovetskiy, L.V., Rengevych, O.V., Zhovnir, G.I.

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    A biosensor approach to probe the structure and function of the adsorbed proteins: fibrinogen at the gold surface by Snopok, B.A., Kostyukevych, K.V., Rengevych, O.V., Shirshov, Yu.M., Venger, E.F., Kolesnikova, I.N., Lugovskoi, E.V.

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