Search Results - Rengevych, O.V.

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    Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy by Rengevych, O.V., Beketov, G.V., Ushenin, Yu.V.

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    Separate determination of thickness and optical parameters by surface plasmon resonance: accuracy consideration by Rengevych, O.V., Shirshov, Yu.M., Ushenin, Yu.V, Beketov, A.G.

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