Харвестер відкритої науки НАН України

Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy

за авторством Rengevych, O.V., Beketov, G.V., Ushenin, Yu.V.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2014)

Separate determination of thickness and optical parameters by surface plasmon resonance: accuracy consideration

за авторством Rengevych, O.V., Shirshov, Yu.M., Ushenin, Yu.V, Beketov, A.G.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (1999)

AFM study of micromorphology and microscopic growth mechanisms of Hg₁₋x CdxTe LPE epitaxial layers

за авторством Beketov, G.V., Rashkovetskiy, L.V., Rengevych, O.V., Zhovnir, G.I.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2000)

A biosensor approach to probe the structure and function of the adsorbed proteins: fibrinogen at the gold surface

за авторством Snopok, B.A., Kostyukevych, K.V., Rengevych, O.V., Shirshov, Yu.M., Venger, E.F., Kolesnikova, I.N., Lugovskoi, E.V.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (1998)