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  • Reshetnyak, M.V.
Showing 1 - 3 results of 3 for search 'Reshetnyak, M.V.', query time: 0.00s Refine Results
  1. 1
    On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples
    On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples
    by Malykhin, S.V., Garkusha, I.E., Makhlay, V.A., Surovitsky, S.V., Reshetnyak, M.V., Borisova, S.S.
    Published in Functional Materials (2017)
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  2. 2
    The methodology for X-ray diffraction investigation of icosahedral quasicrystals substructure
    The methodology for X-ray diffraction investigation of icosahedral quasicrystals substructure
    by Bazdyreva, S.V., Fedchuk, N.V., Malykhin, S.V., Pugachov, A.T., Reshetnyak, M.V., Zubarev, E.N.
    Published in Functional Materials (2013)
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  3. 3
    Growth and structure of WC/Si multilayer x-ray mirror
    Growth and structure of WC/Si multilayer x-ray mirror
    by Pershyn, Y.P., Chumak, V.S., Shypkova, I.G., Mamon, V.V., Devizenko, A.Yu., Kondratenko, V.V., Reshetnyak, M.V., Zubarev, E.N.
    Published in Вопросы атомной науки и техники (2018)
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Characterization and properties Devices and instruments Физика и технология конструкционных материалов

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