Харвестер відкритої науки НАН України

On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples

von Malykhin, S.V., Garkusha, I.E., Makhlay, V.A., Surovitsky, S.V., Reshetnyak, M.V., Borisova, S.S.
Veröffentlicht in Functional Materials (2017)

The methodology for X-ray diffraction investigation of icosahedral quasicrystals substructure

von Bazdyreva, S.V., Fedchuk, N.V., Malykhin, S.V., Pugachov, A.T., Reshetnyak, M.V., Zubarev, E.N.
Veröffentlicht in Functional Materials (2013)

Growth and structure of WC/Si multilayer x-ray mirror

von Pershyn, Y.P., Chumak, V.S., Shypkova, I.G., Mamon, V.V., Devizenko, A.Yu., Kondratenko, V.V., Reshetnyak, M.V., Zubarev, E.N.
Veröffentlicht in Вопросы атомной науки и техники (2018)