Search Results - Reshetnyak, M.V.

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    On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples by Malykhin, S.V., Garkusha, I.E., Makhlay, V.A., Surovitsky, S.V., Reshetnyak, M.V., Borisova, S.S.

    Published in Functional Materials (2017)
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    Growth and structure of WC/Si multilayer x-ray mirror by Pershyn, Y.P., Chumak, V.S., Shypkova, I.G., Mamon, V.V., Devizenko, A.Yu., Kondratenko, V.V., Reshetnyak, M.V., Zubarev, E.N.

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