Theory of oscillations in the STM conductance resulting from subsurface defects (Review Article) by Avotina, Ye.S., Kolesnichenko, Yu.A., van Ruitenbeek, J.M.

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Influence of a single defect on the conductance of a tunnel point contact between a normal metal and a superconductor by Avotina, Ye.S., Kolesnichenko, Yu.A., van Ruitenbeek, J.M.

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Shell effects in alkali metal nanowires by Yanson, A.I., Yanson, I.K., Ruitenbeek, J.M.

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Conductance of a STM contact on the surface of a thin film by Khotkevych, N.V., Kolesnichenko, Yu.A., van Ruitenbeek, J.M.

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Electron tunneling into surface states through an inhomogeneous barrier: asymptotically exact solution of the problem and STM theory by Khotkevych, N.V., Kolesnichenko, Yu.A., van Ruitenbeek, J.M.

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Quantum interference effects in a system of two tunnel point-contacts in the presence of single scatterer: simulation of a double-tip STM experiment by Khotkevych, N.V., Kolesnichenko, Yu.A., van Ruitenbeek, J.M.

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Inhomogeneous broadening of the conductance histograms for molecular junctions by Bopp, J.M., Tewari, S., Sabater, C., van Ruitenbeek, J.M.

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Conductance of a tunnel point contact of noble metals in the presence of a single defect by Avotina, Ye.S., Kolesnichenko, Yu.A., Roobol, S.B., van Ruitenbeek, J.M.

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Point-contact-spectroscopy investigation of the Kondo size effect in CuCr and AuFe alloys by Fisun, V.V., Yanson, I.K., Mydosh, J.A., van Ruitenbeek, J.M.

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Микроконтактные исследования размерного эффекта Кондо в магнитном поле на сплавах CuMn, CuCr и AuFe by Фисун, В.В., Янсон, И.К., van Ruitenbeek, J.M., Mydosh, J.A.

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Size-effect of Kondo scattering in point contacts (revisited) by Yanson, I.K., Fisun, V.V., Bobrov, N.L., Mydosh, J.A., van Ruitenbeek, J.M.

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Size-effect of Kondo scattering by Fe impurities in Cu point contacts by Van der Post, N., Mettes, F., Mydoch, J.A., Ruitenbeek, J.M.van, Yanson, I.K.

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New directions in point-contact spectroscopy based on scanning tunneling microscopy techniques (Review Article) by Tartaglini, E., Verhagen, T.G.A., Galli, F., Trouwborst, M.L., Müller, R., Shiota, T., Aarts, J., van Ruitenbeek, J.M.

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