New Performance Capabilities of Integral Dynamical Diffractometry of Crystal Imperfections by V. V. Lizunov, V. B. Molodkin, S. I. Olikhovskij, S. V. Lizunova, N. G. Tolmachjov, A. I. Nizkova, E. S. Skakunova, S. V. Dmitriev, B. V. Sheludchenko, Ja. V. Vasilik

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The Theory of the Dynamical Krivoglaz—Debye—Waller Factor by S. V. Dmitriev, R. V. Lekhnjak, V. B. Molodkin, V. V. Lizunov, L. N. Skapa, E. S. Skakunova, S. V. Lizunova, S. I. Olikhovskij, E. G. Len, N. G. Tolmachjov

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Theoretical Three-Axes Model of Dynamical Scattering and Formation of Noncrystalline Objects' Image by B. V. Sheludchenko, V. B. Molodkin, S. V. Lizunova, S. I. Olikhovskij, E. N. Kislovskij, Ju. Gaevskij, V. V. Lizunov, A. I. Nizkova, T. P. Vladimirova, V. V. Molodkin

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The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model by V. V. Lizunov, E. V. Kochelab, E. S. Skakunova, E. G. Len, V. B. Molodkin, S. I. Olikhovskij, N. G. Tolmachjov, B. V. Sheludchenko, S. V. Lizunova, L. N. Skapa

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The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. II. Numerical experiment by V. V. Lizunov, E. V. Kochelab, E. S. Skakunova, E. G. Len, V. B. Molodkin, S. I. Olikhovskij, N. G. Tolmachjov, B. V. Sheludchenko, S. V. Lizunova, L. N. Skapa

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The physical nature and new capabilities of use of effects of asymmetry of azimuthal dependence of total integrated intensity of dynamical diffraction for diagnostics of crystals w... by V. B. Molodkin, A. I. Nizkova, E. I. Bogdanov, S. I. Olikhovskij, S. V. Dmitriev, N. G. Tolmachev, V. V. Lizunov, Ja. V. Vasilik, A. G. Karpov, O. G. Vojtok

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Unique informativity of the diffuse dynamical combined diffractometry of materials and products of nanotechnologies by A. P. Shpak, M. V. Kovalchuk, I. M. Karnaukhov, V. V. Molodkin, E. G. Len, A. I. Nizkova, S. I. Olikhovskij, B. V. Sheludchenko, Dzh. E. Ajs, R. I. Barabash

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Integral multiparameter diffractometry of nanosystems on the basis of effects of multiplicity of diffuse scattering by A. P. Shpak, M. V. Kovalchuk, V. B. Molodkin, V. L. Nosik, S. V. Dmitriev, E. G. Len, S. I. Olikhovskij, A. I. Nizkova, V. V. Molodkin, E. V. Pervak, A. A. Katasonov, L. I. Ninichuk, A. V. Melnik

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Basic physics of multiparameter crystallography: diagnostics of defects of several types in single-crystal materials and articles of nanotechnologies by V. B. Molodkin, M. V. Kovalchuk, V. F. Machulin, Kh. Mukhamedzhanov, S. V. Lizunova, S. I. Olikhovskij, E. G. Len, B. V. Sheludchenko, S. V. Dmitriev, E. S. Skakunova, V. V. Molodkin, V. V. Lizunov, V. P. Kladko, E. V. Pervak

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