Харвестер відкритої науки НАН України

X-ray diffraction study of deformation state in InGaN/GaN multilayered structures

von Kladko, V.P., Kuchuk, A.V., Safryuk, N.V., Machulin, V.F., Belyaev, A.E., Konakova, R.V., Yavich, B.S.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2010)

Structural and electrical-physical properties of the ohmic contacts based on palladium to n⁺ -n-n⁺⁺ -n⁺⁺⁺ -InP

von Belyaev, A.E., Boltovets, N.A., Bobyl, A.B., Kladko, V.P., Konakova, R.V., Kudryk, Ya.Ya., Nasyrov, M.U., Sachenko, A.V., Slipokurov, V.S., Slepova, A.S., Safryuk, N.V., Gudymenko, A.I., Shynkarenko, V.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2015)

Ohmic contacts based on Pd to indium phosphide Gunn diodes

von Belyaev, A.E., Boltovets, N.S., Bobyl, A.V., Zorenko, A.V., Arsentiev, I.N., Kladko, V.P., Kovtonyuk, V.M., Konakova, R.V., Kudryk, Ya.Ya., Sachenko, A.V., Slipokurov, V.S., Slepova, A.S., Safryuk, N.V., Gudymenko, A.I., Shynkarenko, V.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2015)